DIFFUSIVE VAPOR TRANSPORT OF CD1-XMNXTE THIN-FILMS

被引：0
|
作者：
MIOTKOWSKI, I
MIOTKOWSKA, S
机构：
来源：
ACTA PHYSICA POLONICA A | 1987年 / 71卷 / 03期
关键词：
D O I：
暂无
中图分类号：
O4 [物理学];
学科分类号：
0702 ;
摘要：
引用
收藏
页码：473 / 475
页数：3
相关论文
共 50 条
  • [1] OPTICAL-CONSTANTS OF CD1-XMNXTE THIN-FILMS
    MIOTKOWSKI, I
    KIERZEKPECOLD, E
    MIOTKOWSKA, S
    ARCISZEWSKA, M
    ACTA PHYSICA POLONICA A, 1988, 73 (03) : 467 - 470
  • [2] CHARACTERIZATION OF LOW-TEMPERATURE MOCVD CD1-XMNXTE THIN-FILMS
    PAIN, GN
    WARMINSKI, T
    SULCS, S
    KWIETNIAK, MS
    GAO, D
    GLANVILL, SR
    ROSSOUW, CJ
    STEVENSON, AW
    RUSSO, SP
    ELLIMAN, RG
    WIELUNSKI, LS
    ROWE, RS
    DEACON, GB
    DICKSON, RS
    WEST, BO
    APPLIED SURFACE SCIENCE, 1991, 48-9 : 76 - 88
  • [3] Pulsed laser deposition of Cd1-xMnxTe thin films
    Caricato, AP
    D'Anna, E
    Fernández, M
    Leggieri, G
    Luches, A
    Mero, E
    Martino, M
    THIN SOLID FILMS, 2003, 433 (1-2) : 45 - 49
  • [4] Pulsed laser deposition of Cd1-xMnxTe thin films
    Caricato, AP
    D'Anna, E
    Fernández, M
    Leggieri, G
    Luches, A
    Mero, E
    Martino, M
    OPTICS FOR THE QUALITY OF LIFE, PTS 1 AND 2, 2003, 4829 : 773 - 774
  • [5] COMPOSITION AND GROWTH-KINETICS OF CD1-XMNXTE THIN-FILMS BY HOT-WALL EPITAXY
    MIOTKOWSKI, I
    MIOTKOWSKA, S
    ACTA PHYSICA POLONICA A, 1986, 69 (06) : 1123 - 1125
  • [6] Low-temperature dynamic susceptibility of thin Cd1-xMnxTe films
    Chandra, S
    Malhotra, LK
    Dhara, S
    Rastogi, AC
    PHYSICAL REVIEW B, 1996, 54 (19): : 13694 - 13704
  • [7] Fundamental absorption edge in thin films of Cd1-xMnxTe solid solutions
    Caraman, I.
    Rusu, G. I.
    Leontie, L.
    JOURNAL OF OPTOELECTRONICS AND ADVANCED MATERIALS, 2006, 8 (03): : 927 - 930
  • [8] PHOTOLUMINESCENCE OF CD1-XMNXTE FILMS GROWN BY METALORGANIC CHEMICAL VAPOR-DEPOSITION
    FENG, ZC
    PERKOWITZ, S
    SUDHARSANAN, R
    ERBIL, A
    POLLARD, KT
    ROHATGI, A
    BRADSHAW, JL
    CHOYKE, WJ
    JOURNAL OF APPLIED PHYSICS, 1989, 66 (04) : 1711 - 1716
  • [9] Ellipsometric characterization of Cd1-xMnxTe thin films in the presence of perturbative fields
    Indian Inst of Technology, New Delhi, India
    Bull Mater Sci, 1 (139-145):
  • [10] Ellipsometric characterization of Cd1-xMnxTe thin films in the presence of perturbative fields
    Chandra, S
    Malhotra, LK
    Rastogi, AC
    BULLETIN OF MATERIALS SCIENCE, 1996, 19 (01) : 139 - 145
12345