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- [3] Measurement of copper in P-type silicon using charge-carrier lifetime methods GETTERING AND DEFECT ENGINEERING IN SEMICONDUCTOR TECHNOLOGY XI, 2005, 108-109 : 643 - 648
- [8] Carrier Transport Properties of p-Type Silicon–Metal Silicide Nanocrystal Composite Films Journal of Electronic Materials, 2015, 44 : 2074 - 2079