OVERCOME TESTING HURDLES POSED BY NEW CMOS LOGIC

被引：0
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作者：
PINO, D
HALL, W
机构：
来源：
ELECTRONIC DESIGN | 1988年 / 36卷 / 02期
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TM [电工技术]; TN [电子技术、通信技术];
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0808 ; 0809 ;
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页码：109 / 112
页数：4
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