COMBINED (1X2)-](1X1) TRANSITION AND ATOMIC ROUGHENING OF GE(001) STUDIED WITH SURFACE X-RAY-DIFFRACTION

被引：35
|
作者：
JOHNSON, AD
NORRIS, C
FRENKEN, JWM
DERBYSHIRE, HS
MACDONALD, JE
VANSILFHOUT, RG
VANDERVEEN, JF
机构：
[1] SERC,DARESBURY LAB,WARRINGTON WA4 4AD,CHESHIRE,ENGLAND
[2] FUNDAMENTEEL ONDERZOEK MAT,INST ATOM & MOLEC PHYS,1098 SJ AMSTERDAM,NETHERLANDS
[3] UNIV COLL CARDIFF,CARDIFF CF1 1XL,S GLAM,WALES
来源：
PHYSICAL REVIEW B | 1991年 / 44卷 / 03期
关键词：
D O I：
10.1103/PhysRevB.44.1134
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
Surface x-ray-diffraction measurements are presented that show a reversible (1 X 2) --> (1 X 1) phase transition of the Ge(001) surface. The variation of the (1 X 2) superlattice reflection intensity with temperature gives a transition temperature of T(c) = 955 +/- 7 K. The data are interpreted as being due to the creation of adatoms and vacancies on the surface with consequent break up of surface dimers. X-ray reflectivity indicates a corresponding loss of height-height correlation across the surface. A simple three-level model is used to describe the reflectivity, and the results are compared with a simple Monte Carlo simulation of the transition.
引用
收藏
页码：1134 / 1138
页数：5
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