SCANNING TUNNELING MICROSCOPE IMAGING TECHNIQUE FOR WEAKLY BONDED SURFACE DEPOSITS

被引：24
|
作者：
JERICHO, MH [1 ]
BLACKFORD, BL [1 ]
DAHN, DC [1 ]
机构：
[1] TECH UNIV NOVA SCOTIA,DEPT ENGN PHYS,HALIFAX B3J 2X1,NS,CANADA
来源：
JOURNAL OF APPLIED PHYSICS | 1989年 / 65卷 / 12期
基金：
美国国家科学基金会;
关键词：
D O I：
10.1063/1.343166
中图分类号：
O59 [应用物理学];
学科分类号：
摘要：
引用
收藏
页码：5237 / 5239
页数：3
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