ELECTRON-DIFFRACTION STUDY OF THE TEXTURE OF CADMIUM SELENIDE THIN-FILMS

被引：0
|
作者：
SAMANTA, D
GHORAI, S
SAMANTARAY, BK
CHAUDHURI, AK
PAL, U
机构：
来源：
INDIAN JOURNAL OF PURE & APPLIED PHYSICS | 1994年 / 32卷 / 11期
关键词：
D O I：
暂无
中图分类号：
O4 [物理学];
学科分类号：
0702 ;
摘要：
Different parameters like texture coefficient, standard deviation, mean disorientation angle and energy characterizing the degree of preferred orientation of CdSe films deposited on glass and mica substrates have been determined from transmission electron diffraction studies. Influence of the substrate temperature on the extent of preferred orientation has been studied.
引用
收藏
页码：909 / 911
页数：3
相关论文
共 50 条
  • [1] STUDY OF GALLIUM POLYMORPHISM IN THIN-FILMS BY ELECTRON-DIFFRACTION
    BERTY, J
    DAVID, MJ
    LAFOURCADE, L
    JOURNAL DE CHIMIE PHYSIQUE ET DE PHYSICO-CHIMIE BIOLOGIQUE, 1977, 74 (09) : 952 - 958
  • [2] ELECTRON-DIFFRACTION STUDY OF TITANIUM-DIOXIDE IN THIN-FILMS
    KHITROVA, VI
    BUNDULE, MF
    PINSKER, ZG
    KRISTALLOGRAFIYA, 1977, 22 (06): : 1253 - 1258
  • [3] QUANTITATIVE ELECTRON-DIFFRACTION FROM THIN-FILMS
    LAGALLY, MG
    SAVAGE, DE
    MRS BULLETIN, 1993, 18 (01) : 24 - 31
  • [4] ELECTRON-DIFFRACTION STUDY OF CRYSTALLIZATION KINETICS OF THIN-FILMS OF SELENIUM
    ALIEV, FI
    SHAFIZAD.RB
    KRISTALLOGRAFIYA, 1974, 19 (05): : 1127 - &
  • [5] ELECTRON-DIFFRACTION STUDY OF CDINGAS4 THIN-FILMS
    ABDULLAYEV, AG
    KYASIMOV, MG
    THIN SOLID FILMS, 1983, 100 (03) : 175 - 179
  • [6] STUDY ON SUPERCOOLING OF BISMUTH THIN-FILMS USING ELECTRON-DIFFRACTION
    DAVID, MJ
    BERTY, J
    LAFOURCADE, L
    THIN SOLID FILMS, 1977, 46 (02) : 177 - 185
  • [7] ELECTRON-DIFFRACTION STUDY OF SUPERCOOLING PHENOMENA ON DIFFERENT METALLIC THIN-FILMS
    BERTY, J
    DAVID, MJ
    LAFOURCADE, L
    JOURNAL DE MICROSCOPIE ET DE SPECTROSCOPIE ELECTRONIQUES, 1978, 3 (03): : 211 - 224
  • [8] ELECTRON-DIFFRACTION ANALYSIS OF POLYCRYSTALLINE AND AMORPHOUS THIN-FILMS
    COCKAYNE, DJH
    MCKENZIE, DR
    ACTA CRYSTALLOGRAPHICA SECTION A, 1988, 44 : 870 - 878
  • [9] ELECTRON-DIFFRACTION DETERMINATION OF INTEGRATED EMISSIVITY OF THIN-FILMS
    BOIKO, BT
    BRATSYKHIN, VM
    PUGACHEV, AT
    HIGH TEMPERATURE, 1971, 9 (03) : 600 - +
  • [10] ELECTRON-DIFFRACTION ANALYSIS OF POLYCRYSTALLINE AND AMORPHOUS THIN-FILMS
    COCKAYNE, DJH
    MCKENZIE, DR
    EUREM 88, VOLS 1-3: TUTORIALS, INSTRUMENTATION AND TECHNIQUES / PHYSICS AND MATERIALS / BIOLOGY, 1988, 93 : 17 - 18
12345