CHARACTERIZATION OF HEAVY RESIDUUM BY A SMALL-ANGLE X-RAY-SCATTERING TECHNIQUE

被引：24
|
作者：
KIM, HG [1 ]
LONG, RB [1 ]
机构：
[1] EXXON RES & ENGN CO,CORP RES LABS,LINDEN,NJ 07036
来源：
INDUSTRIAL & ENGINEERING CHEMISTRY FUNDAMENTALS | 1979年 / 18卷 / 01期
关键词：
D O I：
10.1021/i160069a014
中图分类号：
TQ [化学工业];
学科分类号：
0817 ;
摘要：
引用
收藏
页码：60 / 63
页数：4
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