FIELD-ION MICROSCOPY OF HALOGENS ON TUNGSTEN

被引：21

作者：

FAULIAN, K ^{[1
]}

BAUER, E ^{[1
]}

机构：

[1] SFB 126, D-3392 CLAUSTHAL, FED REP GER

来源：

SURFACE SCIENCE | 1978年 / 70卷 / 01期

关键词：

D O I：

10.1016/0039-6028(78)90415-6

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

引用

页码：271 / 285

页数：15

共 50 条

[1] FIELD-ION MICROSCOPY OF GALLIUM ON TUNGSTEN
CULBERTSON, RJ
SAKURAI, T
TSONG, TT
ULTRAMICROSCOPY, 1979, 4 (03) : 366 - 367
[2] FIELD-ION MICROSCOPY OF FIELD CORROSION OF TUNGSTEN
AMANO, J
LAWSON, RPW
ELECTROCHIMICA ACTA, 1975, 20 (12) : 1001 - 1003
[3] A FIELD-ION MICROSCOPY STUDY OF ION DAMAGE TO TUNGSTEN
FARNUM, DJ
INAL, OT
WALKO, RJ
PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE, 1983, 80 (01): : 287 - 303
[4] HIGH-TEMPERATURE FIELD-ION MICROSCOPY OF TUNGSTEN
MORDYUK, VS
IVANOV, YI
MALTSEV, AN
FIZIKA METALLOV I METALLOVEDENIE, 1988, 66 (03): : 546 - 550
[5] FORMATION OF TUNGSTEN BORIDES STUDIED BY FIELD-ION MICROSCOPY
OHMAE, N
NAKAMURA, A
KOIKE, S
UMENO, M
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1987, 5 (04): : 1367 - 1370
[6] FIELD-ION MICROSCOPY OF TUNGSTEN FOLLOWING VACUUM BREAKDOWN
SYUTKIN, NN
VYATKIN, NN
SOVIET PHYSICS TECHNICAL PHYSICS-USSR, 1972, 16 (09): : 1564 - &
[7] DEPTH OF SPUTTERING DAMAGE IN TUNGSTEN BY FIELD-ION MICROSCOPY
WEBBER, RD
WALLS, JM
RADIATION EFFECTS AND DEFECTS IN SOLIDS, 1979, 45 (1-2): : 111 - 118
[8] FIELD-EMISSION AND FIELD-ION MICROSCOPY OF A ZIRCONIATED TUNGSTEN EMITTER
PELLEG, J
LIU, R
THIN SOLID FILMS, 1992, 221 (1-2) : 318 - 323
[9] OBSERVATION OF THE GOLD-TUNGSTEN INTERFACE BY FIELD-ION MICROSCOPY
CAVALERU, A
SCORTARU, A
REVUE ROUMAINE DE PHYSIQUE, 1980, 25 (01): : 93 - &
[10] EVIDENCE FOR RECONSTRUCTED [001] TUNGSTEN OBTAINED BY FIELD-ION MICROSCOPY
MELMED, AJ
TUNG, RT
GRAHAM, WR
SMITH, GDW
PHYSICAL REVIEW LETTERS, 1979, 43 (20) : 1521 - 1524

← 1 2 3 4 5 →