ELECTRON-MICROSCOPIC INVESTIGATION OF SILICON LAYERS GROWN BY SUBLIMATION IN VACUUM

被引：0
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作者：
KUZNETSOV, VP
TOLOMASOV, VA
SHMENINA, TM
GUDKOVA, NV
机构：
来源：
KRISTALLOGRAFIYA | 1978年 / 23卷 / 03期
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中图分类号：
O7 [晶体学];
学科分类号：
0702 ; 070205 ; 0703 ; 080501 ;
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页码：662 / 663
页数：2
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