SURFACE ALLOYING AT THE SN-PT(111) INTERFACE - A STUDY BY X-RAY PHOTOELECTRON DIFFRACTION

被引：54
|
作者：
GALEOTTI, M [1 ]
ATREI, A [1 ]
BARDI, U [1 ]
ROVIDA, G [1 ]
TORRINI, M [1 ]
机构：
[1] UNIV FIRENZE,DIPARTIMENTO CHIM,I-50129 FLORENCE,ITALY
来源：
SURFACE SCIENCE | 1994年 / 313卷 / 03期
关键词：
D O I：
10.1016/0039-6028(94)90055-8
中图分类号：
O64 [物理化学（理论化学）、化学物理学];
学科分类号：
070304 ; 081704 ;
摘要：
The formation of surface alloys obtained by annealing ultrathin films of Sn deposited on the Pt(111) surface was investigated by low energy electron diffraction and X-ray photoelectron diffraction. The Pt(111)(2 x 2)-Sn and Pt(111)(square-root 3 x square-root 3)R30-degrees-Sn form after deposition of amounts of Sn in the range from 0.2 to 1 ML and subsequent annealing at 1000 K are found by XPD to be single atomic layer surface alloys. Depositing 4-5 ML of Sn and annealing at 400-600 K produces an ordered phase exhibiting a (2 x 2) LEED pattern. This phase is a multilayer surface alloy and it has the same structure as the bulk Pt3Sn alloy. .
引用
收藏
页码：349 / 354
页数：6
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