PERFORMANCE OF A GAMMA-RAY COMPTON SPECTROMETER FOR MOMENTUM DENSITY STUDIES

被引：35
作者：
PATTISON, P
SCHNEIDER, JR
机构：
[1] Hahn-Meitner-Institut für Kernforschung, D-1000 Berlin 39
来源：
NUCLEAR INSTRUMENTS & METHODS | 1979年 / 158卷 / 01期
关键词：
D O I：
10.1016/S0029-554X(79)91275-8
中图分类号：
TH7 [仪器、仪表];
学科分类号：
0804 ; 080401 ; 081102 ;
摘要：
A comparison is made between various ways of measuring electron momentum distributions in crystals. A gamma-ray Compton spectrometer for Compton profile measurements is chosen as the most versatile apparatus available at present. A detailed description is given of the design and operation of a new Compton spectrometer which employs a 100 Ci 198Au source with a strong line at 412 keV. Some results are discussed and the performance of the machine is assessed using data from comparable apparatus in operation elsewhere. © 1979 North-Holland Publishing Co.
引用
收藏
页码：145 / 152
页数：8
相关论文
共 13 条
[1]   COMPTON PROFILE MEASUREMENTS WITH 412 KEV GAMMA-RADIATION [J].
COOPER, M ;
PATTISON, P ;
SCHNEIDER, JR .
PHILOSOPHICAL MAGAZINE, 1976, 34 (02) :243-257
[2]   COMPTON PROFILE MEASUREMENTS OF ALUMINUM AND IRON WITH 662 KEV GAMMA-RADIATION [J].
DUBARD, JL .
PHILOSOPHICAL MAGAZINE B-PHYSICS OF CONDENSED MATTER STATISTICAL MECHANICS ELECTRONIC OPTICAL AND MAGNETIC PROPERTIES, 1978, 37 (03) :273-283
[3]   ELIMINATION OF BACKGROUND IN HIGH-PRECISION COMPTON PROFILE ANALYSIS [J].
ESSLINGER, D ;
HOSEMANN, R ;
MULLER, A ;
WEICK, D .
JOURNAL OF APPLIED PHYSICS, 1974, 45 (09) :4100-4102
[4]   MULTIPLE-SCATTERING AND COMPTON PROFILE OF TITANIUM [J].
FELSTEINER, J ;
PATTISON, P .
PHYSICAL REVIEW B, 1976, 13 (06) :2702-2704
[5]   MONTE-CARLO STUDY OF MULTIPLE-SCATTERING OF PHOTONS IN COMPTON PROFILE MEASUREMENTS [J].
FELSTEINER, J ;
PATTISON, P .
NUCLEAR INSTRUMENTS & METHODS, 1975, 124 (02) :449-453
[6]   COMPTON-SCATTERING WITH SYNCHROTRON RADIATION [J].
HOLT, RS ;
COOPER, M ;
LEA, KR .
JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS, 1978, 11 (01) :68-70
[7]   GAMMA-RAY COMPTON PROFILE OF ALUMINUM [J].
MANNINEN, S ;
PAAKKARI, T ;
KAJANTIE, K .
PHILOSOPHICAL MAGAZINE, 1974, 29 (01) :167-178
[8]  
MANNINEN S, UNPUBLISHED
[9]  
MANNINEN S, 1978, HUP147 U HELS REP SE
[10]   A CORRECTION FOR THE ALPHA-1,ALPHA-2 DOUBLET IN THE MEASUREMENT OF WIDTHS OF X-RAY DIFFRACTION LINES [J].
RACHINGER, WA .
JOURNAL OF SCIENTIFIC INSTRUMENTS AND OF PHYSICS IN INDUSTRY, 1948, 25 (07) :254-255
12