SLOW SCAN DISPLAY SYSTEM FOR A SCANNING ELECTRON-MICROSCOPE

被引：15

作者：

BECK, V ^{[1
]}

机构：

[1] UNIV CHICAGO,ENRICO FERMI INST,CHICAGO,IL 60637

来源：

REVIEW OF SCIENTIFIC INSTRUMENTS | 1973年 / 44卷 / 08期

关键词：

D O I：

10.1063/1.1686301

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

引用

页码：1064 / 1066

页数：3

共 50 条

[1] SCANNING ELECTRON-MICROSCOPE WITH A FULLY COMPUTER-CONTROLLED DISPLAY SYSTEM
不详
SOLID STATE TECHNOLOGY, 1982, 25 (03) : 17 - 18
[2] ELECTRON-MICROSCOPE TRANSMISSION ELECTRON-MICROSCOPE AND SCANNING ELECTRON-MICROSCOPE
WATANABE, T
DENKI KAGAKU, 1986, 54 (08): : 667 - 670
[3] SCANNING ELECTRON-MICROSCOPE ATTACHMENT FOR ELECTRON-MICROSCOPE
MIYAUCHI, K
WATANABE, T
KUBOZOE, M
JOURNAL OF ELECTRON MICROSCOPY, 1972, 21 (03): : 256 - 256
[4] DETECTION SYSTEM FOR SCANNING ELECTRON-MICROSCOPE
HEJNA, J
RADZIMSKI, Z
BUCZKOWSKI, A
SCANNING ELECTRON MICROSCOPY, 1985, : 151 - 156
[5] THE SCANNING ELECTRON-MICROSCOPE AS A TV SYSTEM
GOLUBEV, VP
RADIOTEKHNIKA I ELEKTRONIKA, 1981, 26 (04): : 826 - 833
[6] IMAGE ACCUMULATION, STORAGE, AND DISPLAY SYSTEM FOR A SCANNING-TRANSMISSION ELECTRON-MICROSCOPE
ZUBIN, JA
WIGGINS, JW
REVIEW OF SCIENTIFIC INSTRUMENTS, 1980, 51 (01): : 123 - 131
[7] SCANNING ELECTRON MICROSCOPE-BASED METROLOGICAL ELECTRON-MICROSCOPE SYSTEM AND NEW PROTOTYPE SCANNING ELECTRON-MICROSCOPE MAGNIFICATION STANDARD
POSTEK, MT
SCANNING MICROSCOPY, 1989, 3 (04) : 1087 - 1099
[8] A SCANNING TUNNELING MICROSCOPE SCANNING ELECTRON-MICROSCOPE SYSTEM FOR THE FABRICATION OF NANOSTRUCTURES
EHRICHS, EE
SMITH, WF
DELOZANNE, AL
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1991, 9 (02): : 1380 - 1383
[9] VERSATILE COLOR DISPLAY WITH FRAME STORAGE FOR THE SCANNING ELECTRON-MICROSCOPE
NIKOLAEV, AG
OBYDEN, SK
PERLOVSKI, GA
SAPARIN, GV
IZVESTIYA AKADEMII NAUK SSSR SERIYA FIZICHESKAYA, 1989, 53 (02): : 385 - 388
[10] SCANNING ELECTRON-MICROSCOPE
EVERHART, TE
HAYES, TL
SCIENTIFIC AMERICAN, 1972, 226 (01) : 54 - &

← 1 2 3 4 5 →