IODINE INCORPORATION INTO POLYMERIC FILMS INVESTIGATED BY ANGLE-RESOLVED XPS

被引：10

作者：

BASCHENKO, OA ^{[1
]}

TYZYKHOV, MA ^{[1
]}

NEFEDOV, VI ^{[1
]}

机构：

[1] UNIV LA SAPIENZA,DEPT CHEM,I-00185 ROME,ITALY

来源：

JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA | 1991年 / 56卷 / 03期

关键词：

D O I：

10.1016/0368-2048(91)85003-C

中图分类号：

O433 [光谱学];

学科分类号：

0703 ; 070302 ;

摘要：

Distribution of elements into subsurface layers (up to 120 angstrom thickness) of polyphenylacetylene (PPA) films doped with I2 vapour has been determined by X-ray photoelectron spectroscopy data using a unique numerical technique. Concentration of incorporated iodine has been shown to increase with exposure time; the concentration profiles are dome-shaped and iodine does not penetrate much into the bulk of PPA films, even when exposed to I2 vapours for 1 h. The depth of the layer corresponding to maximum iodine concentration is directly proportional to the iodine exposure time. The non-homogeneous distribution of the doping species in the polymer may be responsible for the low conductivity observed for heterogeneously doped PPA films.

引用

页码：203 / 209

页数：7

共 21 条

[1]

Band I. M., 1979, Atomic Data and Nuclear Data Tables, V23, P443, DOI 10.1016/0092-640X(79)90027-5

[2] DEPTH PROFILING OF ELEMENTS IN SURFACE-LAYERS OF SOLIDS BASED ON ANGULAR RESOLVED X-RAY PHOTOELECTRON-SPECTROSCOPY [J].