INTERFEROMETRIC THICKNESS MEASUREMENTS ON TRANSPARENT THIN FILMS

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作者：
HILL, JS
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来源：
JOURNAL OF PHYSICS D-APPLIED PHYSICS | 1971年 / 4卷 / 06期
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D O I：
10.1088/0022-3727/4/6/302
中图分类号：
O59 [应用物理学];
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页码：741 / &
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