MODELS FOR RELIABILITY AND FAIL-SAFETY EVALUATION OF MICROCOMPUTER CONTROL-SYSTEMS

被引：1

作者：

ZHOU, Z ^{[1
]}

机构：

[1] SHANGHAI INST RAILWAY TECHNOL,SHANGHAI,PEOPLES R CHINA

来源：

MICROELECTRONICS AND RELIABILITY | 1987年 / 27卷 / 05期

关键词：

D O I：

10.1016/0026-2714(87)90332-5

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：839 / 846

页数：8

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