THE PERFORMANCE OF KIMS IN IMAGE RECOGNITION TASKS

被引：1
|
作者：
NTUEN, CA [1 ]
PARK, EH [1 ]
PARK, YH [1 ]
KIM, JH [1 ]
SOHN, KH [1 ]
机构：
[1] N CAROLINA STATE UNIV,RALEIGH,NC 27695
来源：
COMPUTERS & INDUSTRIAL ENGINEERING | 1990年 / 19卷 / 1-4期
关键词：
D O I：
10.1016/0360-8352(90)90114-2
中图分类号：
TP39 [计算机的应用];
学科分类号：
081203 ; 0835 ;
摘要：
KIMS is an acronym for a Knowledge-Based Image Management System developed in the Robotics and Artificial Intelligence Laboratory (RAIL) at North Carolina A&T State University. KIMS model architecture consists of rules which are developed through statistical experimentation with thresholding and quality control chart algorithms. The control architecture of KIMS is driven by the pattern of these rules. KIMS can analyze features of an X-ray image of a manufactured product such as printed circuit board in a real-time mode and make decisions on whether there are defect symptoms in the product. In this paper we present the current performance of KIMS in product inspection decision.
引用
收藏
页码：244 / 248
页数：5
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