INSTABILITY PHENOMENA IN THIN INSULATING FILMS ON SILICON

被引：5
|
作者：
SINGH, BR
SINGH, K
机构：
[1] INDIAN INST TECHNOL, ADV CTR ELECTR SYST, KANPUR 16, UTTAR PRADESH, INDIA
[2] BANARAS HINDU UNIV, DEPT PHYS, VARANASI, UTTAR PRADESH, INDIA
来源：
MICROELECTRONICS RELIABILITY | 1976年 / 15卷 / 05期
关键词：
D O I：
10.1016/0026-2714(76)90600-4
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
引用
收藏
页码：385 / 398
页数：14
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