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- [2] AUGER SPUTTER PROFILING STUDIES OF SI-SIO2 INTERFACE BULLETIN OF THE AMERICAN PHYSICAL SOCIETY, 1978, 23 (03): : 457 - 458
- [5] Si-SiO2 electronic interface roughness as a consequence of Si-SiO2 topographic interface roughness J Electrochem Soc, 3 (1021-1025):
- [6] METASTABILITIES OF SI-SIO2 INTERFACE BULLETIN OF THE AMERICAN PHYSICAL SOCIETY, 1978, 23 (03): : 462 - 463
- [10] Structure of the Si-SiO2 interface EPILAYERS AND HETEROSTRUCTURES IN OPTOELECTRONICS AND SEMICONDUCTOR TECHNOLOGY, 1999, 3725 : 191 - 195