EXCESS NOISE SOURCES DUE TO DEFECTS IN FORWARD BIASED JUNCTIONS

被引：33

|

作者：

BLASQUEZ, G

机构：

来源：

SOLID-STATE ELECTRONICS | 1978年 / 21卷 / 11-1期

关键词：

D O I：

10.1016/0038-1101(78)90219-8

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

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页码：1425 / 1430

页数：6

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