ASYMPTOTIC OPTIMALITY FOR ONE CLASS OF TRUNCATED SEQUENTIAL-TESTS

被引:0
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作者
CHEN, JD
机构
关键词
STOCHASTIC PROCESS OF EXPONENTIAL TYPE; TRUNCATED SEQUENTIAL TESTS; ASYMPTOTIC OPTIMALITY;
D O I
暂无
中图分类号
O29 [应用数学];
学科分类号
070104 ;
摘要
Suppose that (x(t),t greater-than-or-equal-to 0) is a stochastic process of the exponential type with [GRAPHICS] where theta epsilon - subset-of (-infinity, infinity) and V(t) is a measure. For testing the hypothesis theta less-than-or-equal-to theta-0 against theta > theta-0, we have found a class of truncated sequential tests with probability of the first kind of error not exceeding alpha, the expected observation time of tests being asymptotically minimal as alpha down 0.
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页码:30 / 41
页数:12
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