MINORITY-CARRIER DIFFUSION LENGTH MEASUREMENT IN N-TYPE SEMICONDUCTOR BY A PHOTOELECTRO-CHEMICAL METHOD

被引：0
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作者：
SHAO, YF
CHEN, ZY
机构：
来源：
CHINESE PHYSICS | 1987年 / 7卷 / 01期
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中图分类号：
O4 [物理学];
学科分类号：
0702 ;
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页码：266 / 269
页数：4
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