HIGH-SENSITIVITY MOIRE INTERFEROMETRY WITH COMPACT ACHROMATIC INTERFEROMETER

被引:23
|
作者
CZARNEK, R
机构
[1] Virginia Polytechnic Institute, State University, Engineering Science and Mechanics Department, Blacksburg
关键词
D O I
10.1016/0143-8166(90)90029-9
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
Experimental observations and measurements are the sources of information essential for correct development of mathematical models of real structural materials. Moiré interferometry offers high sensitivity in full-field measurements of in-plane displacements on the surface of a specimen. Although it is a powerful method in experimental stress analysis, it has some shortcomings. One is that existing systems require highly coherent light. The only sufficient source of light for this application is a long cavity laser, which is relatively expensive and at best cumbersome. Another shortcoming is that measurements must be performed in a vibration-free environment, such as that found on a holographic table. These requirements limit the use of existing moiré interferometers to a holographic laboratory. In this paper a modified concept of compensation is presented, which permits the use of a chromatic source of light in a compact moiré system. The compensator provides order in the angles of incident light for each separate wavelength, so that the virtual reference grating created by each wavelength in a continuous spectrum is identical in frequency and spatial position. The result is a virtual reference grating that behaves exactly like that created in coherent light. With this development the use of a laser diode, which is a non-coherent light source of tiny dimensions, becomes practical. The special configuration of the optics that create the virtual grating allows its synchronization with the specimen grating and leads to an interferometer design that is relatively insensitive to the vibrations found in a mechanical testing laboratory. Sensitivity to relative motion is analyzed theoretically. This development provides the oppurtunity to apply moiré interferometry to solid mechanics problems that cannot be studied in an optics laboratory. Experimental verification of the optical concepts is provided. A compact moiré interferometer based on the presented idea was developed for measurements of deformation on a testing machine. Its application in both coherent and temporally non-coherent light is demonstrated. © 1990.
引用
收藏
页码:99 / 115
页数:17
相关论文
共 50 条
  • [1] HIGH-SENSITIVITY MEASUREMENT OF STRAIN BY MOIRE INTERFEROMETRY
    MORIMOTO, Y
    HAYASHI, T
    WADA, K
    JSME INTERNATIONAL JOURNAL SERIES I-SOLID MECHANICS STRENGTH OF MATERIALS, 1989, 32 (01): : 122 - 127
  • [2] HIGH-SENSITIVITY MOIRE INTERFEROMETRY - A SIMPLIFIED APPROACH
    POST, D
    BARACAT, WA
    EXPERIMENTAL MECHANICS, 1981, 21 (03) : 100 - 104
  • [3] POLARIZATION APPROACH TO HIGH-SENSITIVITY MOIRE INTERFEROMETRY
    SALBUT, L
    PATORSKI, K
    KUJAWINSKA, M
    OPTICAL ENGINEERING, 1992, 31 (03) : 434 - 439
  • [4] High-temperature, high-sensitivity moire interferometry
    Czarnek, R., 1600, Publ by SEM - Soc for Experimental Mechanics, Inc., Bethel, CT, United States (17):
  • [5] SUPER HIGH-SENSITIVITY MOIRE INTERFEROMETRY WITH OPTICAL MULTIPLICATION
    CZARNEK, R
    OPTICS AND LASERS IN ENGINEERING, 1990, 13 (02) : 87 - 98
  • [6] MOIRE INTERFEROMETRY FOR HIGH-SENSITIVITY MEASUREMENTS IN FRACTURE-MECHANICS
    NICOLETTO, G
    POST, D
    SMITH, CW
    EXPERIMENTAL MECHANICS, 1982, 22 (05) : N39 - N39
  • [7] A compact high-sensitivity heterodyne interferometer for industrial metrology
    Schuldt, Thilo
    Gohlke, Martin
    Weise, Dennis
    Peters, Achim
    Johann, Ulrich
    Braxmaier, Claus
    OPTICAL SENSORS 2008, 2008, 7003
  • [8] IMMERSION INTERFEROMETER FOR MICROSCOPIC MOIRE INTERFEROMETRY
    HAN, B
    POST, D
    EXPERIMENTAL MECHANICS, 1992, 32 (01) : 38 - 41
  • [9] MOIRE STRAIN-GAUGE WITH HIGH-SENSITIVITY
    CHIANG, FP
    YUAN, CL
    KRISHNAMURTH, R
    OPTICAL ENGINEERING, 1988, 27 (03) : 231 - 233
  • [10] HIGH-SENSITIVITY MOIRE DEFLECTOMETRY USING A TELESCOPE
    KAFRI, O
    KRASINSKI, J
    APPLIED OPTICS, 1985, 24 (17): : 2746 - 2747