COMPUTER DECIPHERING OF LAUE PATTERNS - APPLICATION TO WHITE SYNCHROTRON X-RAY TOPOGRAPHY

被引：8
|
作者：
SHEREMETYEV, IA [1 ]
TURBAL, AV [1 ]
LITVINOV, YM [1 ]
MIKHAILOV, MA [1 ]
机构：
[1] FV LUKIN RES & DEV PHYS PROBLEMS INST,MOSCOW 103460,RUSSIA
来源：
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT | 1991年 / 308卷 / 1-2期
关键词：
D O I：
10.1016/0168-9002(91)90692-J
中图分类号：
TH7 [仪器、仪表];
学科分类号：
0804 ; 080401 ; 081102 ;
摘要：
A universal X-ray camera scheme providing exposures and analysis of synchrotron Laue patterns/topographs for any geometry of diffraction experiment is described. Fast and compact computer methods for indexing operating reflections based on crystal orientation data, which are either entirely or partially known in topography studies, are proposed.
引用
收藏
页码：451 / 455
页数：5
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