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- [1] CHANGES IN ELECTRICAL CHARACTERISTICS OF THIN-FILM CONDENSERS WHILE THEIR BREAKDOWN IZVESTIYA VYSSHIKH UCHEBNYKH ZAVEDENII FIZIKA, 1968, (09): : 35 - &
- [2] BREAKDOWN INVESTIGATIONS FOR THIN-FILM CONDENSERS ON BASE OF SILICON MONOOXIDE IN VACUUM IZVESTIYA VYSSHIKH UCHEBNYKH ZAVEDENII FIZIKA, 1970, (06): : 129 - +
- [7] COMPUTATIONAL DYNAMIC MODELING OF THIN-FILM EVAPORATORS AND CONDENSERS JOURNAL OF SOLAR ENERGY ENGINEERING-TRANSACTIONS OF THE ASME, 1980, 102 (03): : 218 - 222
- [9] Extending the 3ω method for thin-film analysis to high frequencies Raudzis, C.E. (carsten.raudzis@de.bosch.com), 1600, American Institute of Physics Inc. (93):