SOME APPLICATIONS OF HIGH-RESOLUTION X-RAY TOPOGRAPHY

被引：0
|
作者：
LANG, AR [1 ]
机构：
[1] UNIV BRISTOL,HH WILLS PHYS LAB,BRISTOL,GLOUCES,ENGLAND
来源：
ACTA CRYSTALLOGRAPHICA SECTION A | 1972年 / 28卷
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D O I：
暂无
中图分类号：
O6 [化学];
学科分类号：
0703 ;
摘要：
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页码：S168 / S169
页数：2
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