SCANNING ELECTRON-BEAM SUB-MICRON ANALYTICAL TECHNIQUES

被引：0
|
作者：
BUONAQUISTI, AD [1 ]
RUSSELL, PE [1 ]
机构：
[1] N CAROLINA STATE UNIV,RALEIGH,NC 27695
来源：
ULTRAMICROSCOPY | 1988年 / 24卷 / 2-3期
关键词：
D O I：
10.1016/0304-3991(88)90303-8
中图分类号：
TH742 [显微镜];
学科分类号：
摘要：
引用
收藏
页码：87 / 96
页数：10
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