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TOPOLOGICAL INTERFEROMETRY WITH DATA REDUCTION FOR QUICK MEASUREMENTS OF DELTA-PARAMETER AND ALPHA-PARAMETER OF PREFORMS AND WAVE-GUIDES
被引:0
|作者:
KOWALIK, W
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D O I:
暂无
中图分类号:
O43 [光学];
学科分类号:
070207 ;
0803 ;
摘要:
A new approach to complex but often repeated measurements of objects of similar class has been presented. A two-stage measurement cycle has been proposed. The first stage consists in finding the theoretical model of the measurement process in the form of a direct transformation of the data to the final results. It has been shown that, as a result of this, the number of measurements as well as all the calculations may be drastically reduced, while the apparatus used may be significantly simplified. The second stage is defined by the measurements realized in real time, for instance, by shifting the examined object in a measuring setup. The described method remains valid for all possible complex measurements. The results shown below, being only an illustration of the method, concern interference measurements of phase objects (such as preforms or fiber waveguides) of both cylindric symmetry and continuous profile of the refractive index.
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页码:271 / 285
页数:15
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