A HIGH-FREQUENCY MODEL BASED ON THE PHYSICAL STRUCTURE OF THE CERAMIC MULTILAYER CAPACITOR

被引：4
|
作者：
DEVREEDE, LCN
DEKOK, M
VANDAM, C
TAURITZ, JL
机构：
[1] Delft University of Technology, Department of Electrical Engineering, Laboratory for Telecommunication and Remote Sensing Technology, Delft, P.O. Box 5031
来源：
IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES | 1992年 / 40卷 / 07期
关键词：
D O I：
10.1109/22.146342
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
In this paper modelling of the high frequency behavior of ceramic multilayer capacitors based on device physics is presented. An accurate predictive model incorporating physical dimensions, material constants and aspects of the CMC application environment is presented. This model is suitable for use in the design and development of improved high frequency CMC structures.
引用
收藏
页码：1584 / 1587
页数：4
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