OBSERVATION OF 2H-NBSE2 SURFACE BY SCANNING TUNNELING MICROSCOPY

被引：2
|
作者：
TOKUMOTO, H [1 ]
BANDO, H [1 ]
KAJIMURA, K [1 ]
MIZUTANI, W [1 ]
MURAKAMI, H [1 ]
OKANO, M [1 ]
OKAYAMA, S [1 ]
ONO, M [1 ]
ONO, Y [1 ]
机构：
[1] SEIKO INSTRUMENTS & ELECTR,CHIBA 271,JAPAN
来源：
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS | 1987年 / 5卷 / 04期
关键词：
D O I：
10.1116/1.574798
中图分类号：
TB3 [工程材料学];
学科分类号：
0805 ; 080502 ;
摘要：
引用
收藏
页码：1090 / 1092
页数：3
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