SURFACE EXAMINATION STEERED BY MICRO-PROCESSORS, UNDER CONDITIONS OF EXTENDED DEFECT ANALYSIS AND SORTING AUTOMATIC

被引：0
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作者：
DROSCHA, H
机构：
来源：
METALL | 1979年 / 33卷 / 04期
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D O I：
暂无
中图分类号：
TF [冶金工业];
学科分类号：
0806 ;
摘要：
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页码：410 / 412
页数：3
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