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- [1] SAMPLE HOLDER FOR LOW-TEMPERATURE INSITU DEFORMATION TESTS IN 200 KV TRANSMISSION ELECTRON-MICROSCOPE HELVETICA PHYSICA ACTA, 1979, 52 (01): : 30 - 30
- [2] 200-KV HIGH-RESOLUTION ELECTRON-MICROSCOPE JOURNAL OF ELECTRON MICROSCOPY, 1979, 28 (03): : 225 - 225
- [3] LOW-TEMPERATURE DEFORMATION IN 200 KEV ELECTRON-MICROSCOPE JOURNAL DE MICROSCOPIE ET DE SPECTROSCOPIE ELECTRONIQUES, 1979, 4 (03): : A24 - A24
- [4] DETERMINATION OF EXPERIMENTAL AND THEORETICAL KASI FACTORS FOR A 200-KV ANALYTICAL ELECTRON-MICROSCOPE JOURNAL OF ELECTRON MICROSCOPY TECHNIQUE, 1989, 11 (01): : 41 - 61
- [5] LOW-TEMPERATURE STAGE IN ELECTRON-MICROSCOPE FOR STUDY ON SUPERCONDUCTORS JOURNAL OF ELECTRON MICROSCOPY, 1980, 29 (04): : 346 - 352
- [6] ANALYSIS OF THIN METALLIC SAMPLES WITH THE AID OF AN ANALYTICAL 200-KV TRANSMISSION ELECTRON-MICROSCOPE MEMOIRES ET ETUDES SCIENTIFIQUES DE LA REVUE DE METALLURGIE, 1985, 82 (09): : 500 - 500
- [9] LOW-TEMPERATURE IN SITU-DEFORMATION IN A 200 KV SCANNING-TRANSMISSION ELECTRON-MICROSCOPE (STEM) JOURNAL DE MICROSCOPIE ET DE SPECTROSCOPIE ELECTRONIQUES, 1979, 4 (05): : 587 - &