CHARGE FRACTIONS IN A HYDROGEN BEAM REFLECTED FROM TARGETS WITH DIFFERENT ELECTRON-DENSITY

The energy and angular dependences of the charge fraction formation during hydrogen ion scattering from Cu, Ni, Mo, W, C, Si, SiO2 are investigated experimentally in the energy interval up to 50 keV. The positive eta+, and negative eta- ion fractions are observed to increase with the decreasing of the free electron concentration at the small angle scattering of particles with (upsilon < upsilon0). It is shown that the values of charged fractions as function of the exit angle are dependent on both the electron properties of the target and the energy of the reflected particles. The dependence of the charge fractions ratio on the path length of the particles in Si is observed. This effect is explained in the frame of the electron capture and loss model. The surface relief influence on the charge fraction formation for the W target is investigated and it is shown that a developed relief makes the charge fraction dependences on the exit angle very weak.