INFLUENCE OF RESONANT PROPERTIES OF A DISCHARGE ON FLUCTUATIONS OF HE-NE-LASER RADIATION

被引：0
|
作者：
ZABORTSEVA, TA
LEVCHENKO, AS
OSTAPCHENKO, EP
STEPANOV, VA
机构：
来源：
RADIOTEKHNIKA I ELEKTRONIKA | 1977年 / 22卷 / 06期
关键词：
D O I：
暂无
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
引用
收藏
页码：1300 / 1302
页数：3
相关论文
共 50 条
  • [1] RESONANT RISE IN HE-NE-LASER RADIATION INTENSITY UNDER DISCHARGE CURRENT MODULATION
    TUCHIN, VV
    AKCHURIN, GG
    KVANTOVAYA ELEKTRONIKA, 1975, 2 (01): : 146 - 148
  • [2] HE-NE-LASER RADIATION INTENSITY MODULATION BY DISCHARGE CURRENT PERTURBATIONS
    TUCHIN, VV
    AKCHURIN, GG
    KVANTOVAYA ELEKTRONIKA, 1975, 2 (10): : 2355 - 2356
  • [3] OSCILLATIONS IN A DISCHARGE GAP OF A HE-NE-LASER AND THEIR INFLUENCE ON EMISSION PARAMETERS
    ZAKHARENKO, YG
    PRIVALOV, VE
    OPTIKA I SPEKTROSKOPIYA, 1973, 35 (04): : 750 - 758
  • [4] MICRODENSITOMETER WITH A HE-NE-LASER AS RADIATION SOURCE
    HOESCHEN, D
    MIRANDE, W
    OPTIK, 1977, 48 (05): : 459 - 470
  • [5] TRANSVERSE HF-DISCHARGE HE-NE-LASER
    KUZOVNIKOV, AA
    NOVOSELOV, AN
    SAVINOV, VP
    YAKUNIN, VG
    RADIOTEKHNIKA I ELEKTRONIKA, 1980, 25 (08): : 1677 - 1682
  • [6] INVESTIGATION OF SPATIAL-TIME CORRELATION OF HE-NE-LASER RADIATION INTENSITY FLUCTUATIONS
    RENDEL, YS
    RADIOTEKHNIKA I ELEKTRONIKA, 1978, 23 (04): : 793 - 797
  • [7] STATISTICAL PROPERTIES OF HE-NE-LASER RADIATION REFLECTED THROUGH A TURBULENT ATMOSPHERE
    BENSIMON, D
    ENGLANDER, A
    SHTRIKMAN, S
    SLATKINE, M
    TREVES, D
    APPLIED OPTICS, 1981, 20 (06): : 947 - 950
  • [8] EFFECT OF HE-NE-LASER RADIATION ON ADHESIVE PROPERTIES OF THE CELL-MEMBRANE
    KARU, TI
    PYATIBRAT, LV
    KALENDO, GS
    BULLETIN OF EXPERIMENTAL BIOLOGY AND MEDICINE, 1993, 115 (06) : 695 - 697
  • [9] AN INFLUENCE OF A MICROWAVE FIELD ON THE HE-NE-LASER ACTION
    GOLIKOVA, EV
    GOLOVITSKII, AP
    KRUZHALOV, VA
    PERCHANOK, TM
    KVANTOVAYA ELEKTRONIKA, 1982, 9 (02): : 432 - 434
  • [10] Frequenzstabilisierter He-Ne-laser
    Anon
    F and M; Feinwerktechnik, Mikrotechnik, Messtechnik, 2001, 109 (06):
12345