EMPIRICAL LIFETIMES FOR 4S4P 1,3P-DEGREES-1 LEVELS IN THE ZINC ISOELECTRONIC SEQUENCE

Empirical predictions are reported for the lifetimes of the 4s2-4s4p resonance and intercombination transitions in the Zn isoelectronic sequence. The approach uses a direct-mapping reduction of available energy-level and lifetime data and imposes no theoretical assumptions or restrictions. Measured spectroscopic energy-level data are used to characterize intermediate coupling effects in terms of an effective singlet-triplet mixing angle, which is then used to convert lifetime data into mixing-reduced effective line strength factors. Through a linearizing screening parameterization, these reduced line strength factors are found to exhibit regularities that permit accurate interpolation, extrapolation, and smoothing and also provide a convenient exposition for sensitive comparison between experimental results and ab initio calculations.