FIELD-EMISSION STUDIES OF SURFACE MIGRATION FOR TUNGSTEN RHENIUM IRIDIUM AND RHODIUM

被引：42
作者：
BETTLER, PC
BARNES, G
机构：
[1] University of Nevada, Reno, NV
来源：
SURFACE SCIENCE | 1968年 / 10卷 / 02期
关键词：
D O I：
10.1016/0039-6028(68)90017-4
中图分类号：
O64 [物理化学（理论化学）、化学物理学];
学科分类号：
070304 ; 081704 ;
摘要：
The activation energy and the diffusivity constant for surface migration, and the surface tension of the solid phase have been measured for several of the refractory metals by the pulsed field-emission techniques. The results of this work bring into question the reliability of the stopping-potential" method for the measurement of the solid state surface tension. © 1968."
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页码：165 / &
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