THERMAL-STABILITY OF PB-ALLOY JOSEPHSON JUNCTION ELECTRODE MATERIALS .4. EFFECTS OF CRYSTAL-STRUCTURE OF PB-BI COUNTER ELECTRODES

被引：10

作者：

BASSON, JH ^{[1
]}

MURAKAMI, M ^{[1
]}

BOOYENS, H ^{[1
]}

机构：

[1] IBM CORP,THOMAS J WATSON RES CTR,YORKTOWN HTS,NY 10598

来源：

JOURNAL OF APPLIED PHYSICS | 1982年 / 53卷 / 01期

关键词：

D O I：

10.1063/1.329936

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

页码：337 / 345

页数：9

共 11 条

[1] THERMAL-STABILITY OF PB-ALLOY JOSEPHSON JUNCTION ELECTRODE MATERIALS .6. EFFECTS OF FILM EDGES ON THE STRAIN DISTRIBUTION OF PB-BI COUNTER-ELECTRODES
MURAKAMI, M
JOURNAL OF APPLIED PHYSICS, 1982, 53 (05) : 3560 - 3565
[2] THERMAL-STABILITY OF PB-ALLOY JOSEPHSON JUNCTION ELECTRODE MATERIALS .8. EFFECTS OF AU ADDITION TO PB-BI COUNTERELECTRODES
MURAKAMI, M
HUANG, HCW
KIRCHER, CJ
JOURNAL OF APPLIED PHYSICS, 1983, 54 (02) : 743 - 747
[3] THERMAL-STABILITY OF PB-ALLOY JOSEPHSON JUNCTION ELECTRODE MATERIALS .5. EFFECTS OF REPEATED CYCLING BETWEEN 298 AND 4.2K OF PB-BI COUNTER ELECTRODE
MURAKAMI, M
BASSON, JH
JOURNAL OF APPLIED PHYSICS, 1982, 53 (01) : 346 - 352
[4] THERMAL-STABILITY OF PB-ALLOY JOSEPHSON JUNCTION ELECTRODE MATERIALS .9. MULTILAYERED PB-IN-AU ELECTRODES
MURAKAMI, M
ALESSANDRINI, EI
MAGERLEIN, JH
JOURNAL OF APPLIED PHYSICS, 1983, 54 (10) : 5771 - 5778
[5] THERMAL-STABILITY OF PB-ALLOY JOSEPHSON JUNCTION ELECTRODE MATERIALS .7. CONCENTRATION RANGE OF SINGLE EPSILON-PHASE PB-BI FILMS USED IN COUNTERELECTRODES
MURAKAMI, M
HUANG, HCW
ANGILELLO, J
GILBERT, BL
JOURNAL OF APPLIED PHYSICS, 1983, 54 (02) : 738 - 742
[6] THERMAL-STABILITY OF PB-ALLOY JOSEPHSON JUNCTION ELECTRODE MATERIALS .3. CORRELATION OF MICROSTRUCTURE AND STRAIN IN PB-IN-AU BASE ELECTRODES
MURAKAMI, M
SERRANO, CM
JOURNAL OF APPLIED PHYSICS, 1982, 53 (01) : 326 - 336
[7] THERMAL-STABILITY OF PB-ALLOY JOSEPHSON JUNCTION ELECTRODE MATERIALS .2. EFFECTS OF SIO COATING ON PB-IN-AU BASE ELECTRODE
MURAKAMI, M
JOURNAL OF APPLIED PHYSICS, 1981, 52 (03) : 1320 - 1327
[8] THERMAL-STABILITY OF PB-ALLOY JOSEPHSON JUNCTION ELECTRODE MATERIALS .1. EFFECTS OF FILM THICKNESS AND GRAIN-SIZE OF PB-IN-AU BASE ELECTRODES
MURAKAMI, M
JOURNAL OF APPLIED PHYSICS, 1981, 52 (03) : 1309 - 1319
[9] STRAIN RELAXATION IN PB-ALLOY JOSEPHSON JUNCTION ELECTRODE MATERIALS
MURAKAMI, M
KIRCHER, CJ
IEEE TRANSACTIONS ON MAGNETICS, 1979, 15 (01) : 443 - 445
[10] COMPARISON OF TEMPERATURE CYCLING STABILITY OF PB-ALLOY JOSEPHSON-JUNCTIONS WITH VARIOUS COUNTER ELECTRODE MATERIALS
GATES, JV
PEI, SS
IEEE TRANSACTIONS ON MAGNETICS, 1983, 19 (03) : 816 - 819

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