STRESS EFFECTS OF WATER SORPTION IN CURE BAKED PHOTORESIST UNDERLAYERS AN THE MAGNETIC EASY-AXIS OF PERMALLOY FILM OVERLAYERS

被引:1
|
作者
KASIRAJ, P
MOYLAN, CR
FONTANA, RE
机构
[1] IBM Research Division Almaden Research Center, San Jose, California 95120-6099
关键词
D O I
10.1109/20.333934
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Variations in the uniaxial mechanical stress of permalloy films can change the magnetic easy axis of the permalloy films through the magnetostrictive effect. Conventional inductive film heads are fabricated with the use of cure baked photoresist (CBP). We show that water absorption in the CBP can produce significant changes in the magnetic properties of permalloy films similar to those used in recording head yokes. The diffusion coefficient of water in 3 mu m thick CBP films was measured with a quartz crystal microbalance and found to be 2.2 x 10(-9) cm(2)/s at 25 degrees C. A large and reversible change in the magnetic easy axis is observed in 1 mu thick permalloy films that overlay a mound of CBP when it is exposed to water vapor. We infer from the observed magnetic easy axis changes that uniaxial stresses of greater than 5 x 10(8) dynes/cm(2) are produced due to the swelling and contraction of the underlaying CBP.
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页码:3888 / 3890
页数:3
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