A LOW-TEMPERATURE STAGE FOR USE WITH A REFLECTING MICROSCOPE

被引:3
|
作者
FERGUSON, J
WIGNALL, TF
机构
来源
SPECTROCHIMICA ACTA | 1959年 / 15卷 / 12期
关键词
D O I
10.1016/S0371-1951(59)80416-1
中图分类号
O433 [光谱学];
学科分类号
0703 ; 070302 ;
摘要
引用
收藏
页码:1127 / 1128
页数:2
相关论文
共 50 条
  • [1] A LOW-TEMPERATURE MICROSCOPE STAGE
    RHODES, RG
    JOURNAL OF SCIENTIFIC INSTRUMENTS, 1950, 27 (12): : 333 - 334
  • [2] A LOW-TEMPERATURE MICROSCOPE STAGE FOR METAL SPECIMENS
    HULL, D
    GARWOOD, RD
    JOURNAL OF SCIENTIFIC INSTRUMENTS, 1955, 32 (06): : 232 - 233
  • [3] LOW-TEMPERATURE STAGE IN ELECTRON-MICROSCOPE FOR STUDY ON SUPERCONDUCTORS
    MIYAZAKI, T
    AOKI, R
    SHINOZAKI, B
    YAMASHITA, S
    JOURNAL OF ELECTRON MICROSCOPY, 1980, 29 (04): : 346 - 352
  • [4] A LOW-TEMPERATURE LUMINESCENCE MICROSCOPE
    MASKASKY, JE
    JOURNAL OF IMAGING SCIENCE, 1988, 32 (01): : 15 - 16
  • [5] Design and application of a low-temperature Peltier-cooling microscope stage
    Hsu, CC
    Walsh, AJ
    Nguyen, HM
    Overcashier, DE
    KoningBastiaan, H
    Bailey, RC
    Nail, SL
    JOURNAL OF PHARMACEUTICAL SCIENCES, 1996, 85 (01) : 70 - 74
  • [6] COMBINED FREEZE CHAMBER AND LOW-TEMPERATURE STAGE FOR AN ELECTRON-MICROSCOPE
    VALDRE, U
    HORNE, RW
    JOURNAL OF MICROSCOPY, 1975, 103 (APR) : 305 - 317
  • [7] SPECIMEN STAGE FOR LOW-TEMPERATURE TENSILE DEFORMATION IN AN ELECTRON-MICROSCOPE
    TAKEUCHI, T
    IKEDA, S
    IKENO, S
    FURUBAYASHI, E
    JAPANESE JOURNAL OF APPLIED PHYSICS, 1973, 12 (01) : 142 - 145
  • [8] LOW-TEMPERATURE SCANNING TUNNELING MICROSCOPE FOR USE AN ARTIFICIALLY FABRICATED NANOSTRUCTURES
    WILDOER, JWG
    VANROY, AJA
    VANKEMPEN, H
    HARMANS, CJPM
    REVIEW OF SCIENTIFIC INSTRUMENTS, 1994, 65 (09): : 2849 - 2852
  • [9] LOW-TEMPERATURE SCANNING TUNNELING MICROSCOPE
    MARTI, O
    BINNIG, G
    ROHRER, H
    SALEMINK, H
    SURFACE SCIENCE, 1987, 181 (1-2) : 230 - 234
  • [10] THE DESIGN AND USE OF A LOW-TEMPERATURE STAGE FOR LIGHT-MICROSCOPY
    REID, DS
    RALL, WF
    ROSENTHAL, M
    CRYOBIOLOGY, 1980, 17 (06) : 615 - 615