OXIDATION OF SILICON WITHOUT FORMATION OF STACKING-FAULTS

被引:24
|
作者
MURARKA, SP [1 ]
LEVINSTEIN, HJ [1 ]
MARCUS, RB [1 ]
WAGNER, RS [1 ]
机构
[1] BELL TEL LABS INC,MURRAY HILL,NJ 07974
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D O I
10.1063/1.324241
中图分类号
O59 [应用物理学];
学科分类号
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引用
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页码:4001 / 4003
页数:3
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