HIGH TEMPERATURE X-RAY DIFFRACTION TECHNIQUES FOR ACTIVE METALS

被引：3
|
作者：
HANAK, JJ
DAANE, AH
机构：
来源：
REVIEW OF SCIENTIFIC INSTRUMENTS | 1961年 / 32卷 / 06期
关键词：
D O I：
10.1063/1.1717476
中图分类号：
TH7 [仪器、仪表];
学科分类号：
0804 ; 080401 ; 081102 ;
摘要：
引用
收藏
页码：712 / &
相关论文
共 50 条
  • [1] HIGH TEMPERATURE X-RAY DIFFRACTION TECHNIQUES
    LANDER, JJ
    REVIEW OF SCIENTIFIC INSTRUMENTS, 1949, 20 (01): : 82 - 83
  • [2] HIGH TEMPERATURE FURNACE FOR X-RAY DIFFRACTION OF LIQUID METALS
    JOSHI, ML
    REVIEW OF SCIENTIFIC INSTRUMENTS, 1965, 36 (05): : 678 - &
  • [3] HIGH TEMPERATURE X-RAY DIFFRACTION CAMERA
    CONNELL, LF
    REVIEW OF SCIENTIFIC INSTRUMENTS, 1947, 18 (05): : 367 - 367
  • [4] A HIGH TEMPERATURE X-RAY DIFFRACTION APPARATUS
    BIRKS, LS
    FRIEDMAN, H
    REVIEW OF SCIENTIFIC INSTRUMENTS, 1947, 18 (08): : 576 - 580
  • [5] A HIGH TEMPERATURE X-RAY DIFFRACTION CAMERA
    EDWARDS, JW
    SPEISER, R
    JOHNSTON, HL
    PHYSICAL REVIEW, 1948, 73 (10): : 1251 - 1251
  • [6] HIGH TEMPERATURE X-RAY DIFFRACTION CAMERA
    CHESLEY, FG
    REVIEW OF SCIENTIFIC INSTRUMENTS, 1946, 17 (12): : 558 - 558
  • [7] A HIGH TEMPERATURE X-RAY DIFFRACTION CAMERA
    EDWARDS, JW
    SPEISER, R
    JOHNSTON, HL
    REVIEW OF SCIENTIFIC INSTRUMENTS, 1949, 20 (05): : 343 - 347
  • [8] HIGH TEMPERATURE X-RAY DIFFRACTION CAMERA
    AUSTIN, AE
    RICHARD, NA
    SCHWARTZ, CM
    REVIEW OF SCIENTIFIC INSTRUMENTS, 1956, 27 (10): : 860 - 862
  • [9] X-ray diffraction techniques
    Zaumseil, P
    EFFECT OF DISORDER AND DEFECTS IN ION-IMPLANTED SEMICONDUCTORS : ELECTRICAL AND PHYSICOCHEMICAL CHARACTERIZATION, 1997, 45 : 261 - 282
  • [10] THE TEMPERATURE CALIBRATION OF A HIGH TEMPERATURE X-RAY DIFFRACTION CAMERA
    BRAND, JA
    GOLDSCHMIDT, HJ
    JOURNAL OF SCIENTIFIC INSTRUMENTS, 1956, 33 (02): : 41 - 45
12345