RANDOM AND AN ALGORITHMIC TECHNIQUE FOR FAULT DETECTION TEST GENERATION FOR SEQUENTIAL CIRCUITS

被引：18

|

作者：

BREUER, MA

机构：

来源：

IEEE TRANSACTIONS ON COMPUTERS | 1971年 / C 20卷 / 11期

关键词：

D O I：

10.1109/T-C.1971.223140

中图分类号：

TP3 [计算技术、计算机技术];

学科分类号：

0812 ;

摘要：

引用

收藏

页码：1364 / &

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