AUTOMATIZED SYSTEM FOR SIMULTANEOUS MEASUREMENT OF THERMOELECTRIC-POWER AND SHEET CONDUCTIVITY, APPLICATION TO SEMICONDUCTING POLYMER LAYERS

被引：14

作者：

MOLITON, A ^{[1
]}

RATIER, B ^{[1
]}

MOREAU, C ^{[1
]}

FROYER, G ^{[1
]}

机构：

[1] CNET,OCM LAB,F-22301 LANNION,FRANCE

来源：

JOURNAL DE PHYSIQUE III | 1991年 / 1卷 / 05期

关键词：

D O I：

10.1051/jp3:1991153

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

In this paper, we present an automatized system for simultaneous measurement of conductivity sigma and thermoelectric power S: measurements are allowed for temperatures ranging from 130 K to 360 K on brittle semiconductor layers. As an example of the application, results obtained in the case of polymer (PPP) layers implanted with Na ions are presented: with high energy implantation (E = 250 keV) we observe only a defect semiconduction of p type while at low energy (30 keV) an electronic n type conduction appears.

引用

页码：809 / 826

页数：18

共 18 条

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REVIEW OF SCIENTIFIC INSTRUMENTS, 1995, 66 (01): : 199 - 206
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