WAVELENGTH-SCANNING POLARIZATION-MODULATION ELLIPSOMETRY - SOME PRACTICAL CONSIDERATIONS

被引：59
作者：
BERMUDEZ, VM
RITZ, VH
机构：
来源：
APPLIED OPTICS | 1978年 / 17卷 / 04期
关键词：
D O I：
10.1364/AO.17.000542
中图分类号：
O43 [光学];
学科分类号：
070207 ; 0803 ;
摘要：
引用
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页码：542 / 552
页数：11
相关论文
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