共 50 条
- [2] SURFACE-ROUGHNESS AND SPUTTERING YIELD OF HEAVILY ION-IMPLANTED SURFACES NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 1989, 37-8 : 325 - 328
- [6] Measurement of the damage profile of ion-implanted GaAs using an optical method SIMC-XI: 2000 INTERNATIONAL SEMICONDUCTING AND INSULATING MATERIALS CONFERENCE, PROCEEDINGS, 2000, : 145 - 148
- [7] OPTICAL BISTABILITY IN ION-IMPLANTED SEMICONDUCTORS PISMA V ZHURNAL TEKHNICHESKOI FIZIKI, 1987, 13 (06): : 337 - 340
- [10] Measurement of the damage profile of ion-implanted GaAs using an automated optical profiler NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 2001, 173 (04): : 528 - 532