TESTING AND IMPROVING THE TESTABILITY OF MULTIMEGABIT MEMORIES

被引：0
|
作者：
MAZUMDER, P
HAYES, JP
机构：
来源：
IEEE DESIGN & TEST OF COMPUTERS | 1993年 / 10卷 / 01期
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暂无
中图分类号：
TP3 [计算技术、计算机技术];
学科分类号：
0812 ;
摘要：
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页码：6 / 7
页数：2
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