A METHOD FOR GENERATING WEIGHTED RANDOM TEST PATTERNS

被引:72
|
作者
WAICUKAUSKI, JA [1 ]
LINDBLOOM, E [1 ]
EICHELBERGER, EB [1 ]
FORLENZA, OP [1 ]
机构
[1] IBM CORP,DIV DATA SYST,KINGSTON,NY 12401
关键词
D O I
10.1147/rd.332.0149
中图分类号
TP3 [计算技术、计算机技术];
学科分类号
0812 ;
摘要
引用
收藏
页码:149 / 161
页数:13
相关论文
共 50 条
  • [1] Generating Realistic Labelled, Weighted Random Graphs
    Davis, Michael Charles
    Ma, Zhanyu
    Liu, Weiru
    Miller, Paul
    Hunter, Ruth
    Kee, Frank
    ALGORITHMS, 2015, 8 (04) : 1143 - 1174
  • [2] On chip weighted random patterns
    Savir, J
    SIXTH ASIAN TEST SYMPOSIUM (ATS'97), PROCEEDINGS, 1997, : 344 - 352
  • [3] Pseudorandom, weighted random and pseudoexhaustive test patterns generated in universal cellular automata
    Novák, O
    DEPENDABLE COMPUTING - EDCC-3, 1999, 1667 : 303 - 320
  • [4] Efficient Monte Carlo method for generating random test data from irregular test regions
    Jamoussi, A
    Bastani, FB
    SEKE '96: THE 8TH INTERNATIONAL CONFERENCE ON SOFTWARE ENGINEERING AND KNOWLEDGE ENGINEERING, PROCEEDINGS, 1996, : 17 - 24
  • [5] On-Chip Weighted Random Patterns
    Jacob Savir
    Journal of Electronic Testing, 1998, 13 : 41 - 50
  • [6] Module level weighted random patterns
    Savir, J
    JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS, 1997, 10 (03): : 283 - 287
  • [7] Distributed generation of weighted random patterns
    Savir, J
    16TH IEEE VLSI TEST SYMPOSIUM, PROCEEDINGS, 1998, : 225 - 232
  • [8] Distributed generation of weighted random patterns
    Savir, J
    IEEE TRANSACTIONS ON COMPUTERS, 1999, 48 (12) : 1364 - 1368
  • [9] Module Level Weighted Random Patterns
    Jacob Savir
    Journal of Electronic Testing, 1997, 10 : 283 - 287
  • [10] On-chip weighted random patterns
    Savir, J
    JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS, 1998, 13 (01): : 41 - 50