APPLICATIONS OF X-RAY SPECTROMETRIC ANALYSIS IN SIDERURGICAL LABORATORIES

被引：0
|
作者：
HANCART, J
机构：
来源：
INDUSTRIE CHIMIQUE BELGE-BELGISCHE CHEMISCHE INDUSTRIE | 1968年 / 33卷
关键词：
D O I：
暂无
中图分类号：
TQ [化学工业];
学科分类号：
0817 ;
摘要：
引用
收藏
页码：155 / &
相关论文
共 50 条
  • [1] X-ray spectrometric applications of a synchrotron x-ray microbeam
    Iida, A
    X-RAY SPECTROMETRY, 1997, 26 (06) : 359 - 363
  • [2] X-Ray Spectrometric Applications of a Synchrotron X-Ray Microbeam
    Photon Factory, Natl. Lab. for High Energy Physics, 1-1 O-ho, Tsukuba, Ibaraki 305, Japan
    X-Ray Spectrometry, 26 (06): : 359 - 363
  • [3] FLUORESCENT X-RAY SPECTROMETRIC ANALYSIS OF OXYGEN
    UCHIKAWA, H
    NUMATA, M
    JAPAN ANALYST, 1971, 20 (09): : 1207 - &
  • [4] Applications of X-ray analysis
    Cornish, LA
    SOUTH AFRICAN JOURNAL OF SCIENCE, 1996, 92 (06) : 274 - &
  • [5] X-RAY SPECTROMETRIC ANALYSIS OF THIN METALLIC FOILS
    BONDAR, AD
    KAREV, VN
    KLYUCHAREV, AP
    NIKOLAICHUK, AD
    INDUSTRIAL LABORATORY, 1962, 28 (12): : 1544 - 1546
  • [6] FLUORESCENT X-RAY SPECTROMETRIC ANALYSIS OF SOLUTIONS - (A REVIEW)
    KAKHANA, MM
    INDUSTRIAL LABORATORY, 1960, 26 (12): : 1544 - 1549
  • [7] Analysis of medieval glass by X-ray spectrometric methods
    Smit, Z
    Pelicon, P
    Vidmar, G
    Zorko, B
    Budnar, M
    Demortier, G
    Gratuze, B
    Sturm, S
    Necemer, M
    Kump, P
    Kos, M
    NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 2000, 161 : 718 - 723
  • [8] Analysis of medieval glass by X-ray spectrometric methods
    Šmit, Z.
    Pelicon, P.
    Vidmar, G.
    Zorko, B.
    Budnar, M.
    Demortier, G.
    Gratuze, B.
    Šturm, S.
    Nečemer, M.
    Kump, P.
    Kos, M.
    Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms, 2000, 161 : 718 - 723
  • [9] DATA-PROCESSING IN X-RAY SPECTROMETRIC ANALYSIS
    GRAZZINI, M
    FOCARDI, E
    FABENE, R
    GIANNINI, L
    JOURNAL DE MICROSCOPIE ET DE SPECTROSCOPIE ELECTRONIQUES, 1977, 2 (03): : A17 - A17
  • [10] SOME PROBLEMS OF FLUORESCENT X-RAY SPECTROMETRIC ANALYSIS
    BYKOV, VP
    SOROKIN, IV
    INDUSTRIAL LABORATORY, 1961, 27 (11): : 1376 - 1378
12345