RAMAN-SPECTROSCOPY - VERSATILE TOOL FOR CHARACTERIZATION OF THIN-FILMS AND HETEROSTRUCTURES OF GAAS AND ALXGA1-XAS

被引：208

作者：

ABSTREITER, G ^{[1
]}

BAUSER, E ^{[1
]}

FISCHER, A ^{[1
]}

PLOOG, K ^{[1
]}

机构：

[1] MAX PLANCK INST FESTKORPERFORSCH,D-7000 STUTTGART 80,FED REP GER

来源：

APPLIED PHYSICS | 1978年 / 16卷 / 04期

关键词：

D O I：

10.1007/BF00885858

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

页码：345 / 352

页数：8

共 24 条

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[10] DIRECT OBSERVATION OF SUPERLATTICE FORMATION IN A SEMICONDUCTOR HETEROSTRUCTURE [J].

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