GAAS HALL SENSORS MADE BY THE MOCVD TECHNIQUE

被引:4
|
作者
CAMPESATO, R [1 ]
FLORES, C [1 ]
PASSASEO, A [1 ]
VERNI, S [1 ]
机构
[1] CNRSM,I-72023 MESAGNE,ITALY
关键词
D O I
10.1016/0924-4247(92)80058-B
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
The ability of Hall sensors to measure a magnetic field and their properties as multipliers have led to many industrial applications. In particular, GaAs sensors offer a wide operating temperature range, a very small Hall voltage temperature coefficient and an excellent linearity with magnetic field. An improved GaAs Hall sensor can be achieved by growing the GaAs layers by the MOCVD (metal organic chemical vapour deposition) technique. MOCVD permits good control and high quality of the material parameters involved in Hall sensor behaviour. A first characterization of the epitaxial material has been accomplished and the GaAs parameters have been measured in the temperature range - 190- + 100-degrees-C, to optimize the sensor performances. The fabrication process is described and the figures of merit of the device (e.g., sensitivity, linearity, temperature coefficients) have been analysed as a function of the material parameters.
引用
收藏
页码:651 / 655
页数:5
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