DIRECT METHOD FOR EVALUATING SCATTERING-MATRIX SENSITIVITIES

被引：17
|
作者：
BANDLER, JW
SEVIORA, RE
机构：
来源：
ELECTRONICS LETTERS | 1970年 / 6卷 / 24期
关键词：
D O I：
10.1049/el:19700535
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
引用
收藏
页码：773 / &
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